Bedzyk Research Group - ATX-G


 
Rigaku ATX-G Thin Film Diffractometer
The Rigaku ATX-G (click for larger image).
The ATX-G is used for:
    • X-ray Reflectivity (XRR) → Electron density profile     • Crystal Truncation Rod (CTR) → Interface morphology

Specifications:
    • Rigaku 18 kW rotating anode with Cu or Mo target
Schematic of the ATX-G setup (from Rigaku Journal ATX-G Article).