Rigaku ATX-G Thin Film Diffractometer

Photo of the instrument opened up on a laser table taking up an entire small room

The Rigaku ATX-G (click for larger image).

The ATX-G is used for:

X-ray Reflectivity (XRR) → Electron density profile
Crystal Truncation Rod (CTR) → Interface morphology

Specifications:

Rigaku 18 kW rotating anode with Cu or Mo target

Sample on a rotating stage with X-ray source, high resolution (4-crystal) monochromator and/or Soller slit sends X-rays to sample, then are collected by the detector after going through the Attenuator and Soller slit

Schematic of the ATX-G setup (from Rigaku Journal ATX-G Article).

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