Ultra-high Vacuum (UHV) Growth and Characterization System

Photo of instrument showing Dual Anode X-ray Source, Hemispherical Analyzer, STM, Sample Load Lock, Sample Heating feedthroughs (for resistive and filament heating), Sputter Gun, MBE flange (2 K-cells, 1 e-beam evaporator), and LEED. A panel reads: Not shown in photo: AES (on MBE side), MBE X-Y-Z-theta Sample Manipulator, Triple E-beam (on STM side)

Molecular-beam epitaxy (MBE) side of UHV system

Photo of instrument from different view showing Quartz Crystal Monitor, RGA, STM, Dual Anode X-ray Source, Triple E-beam evaporator, and Hemispherical Analyzer (for XPS)

X-ray Photoelectron Spectroscopy (XPS) side of UHV system

Close-up photo on interior of setup for STM and AFM

UHV scanning-tunneling microscopy (STM) / atomic force microscopy (AFM)

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